Ellipsometer

Key Features:

• Non-Destructive & Non-Contact: Measures films and surfaces without damaging or altering the sample.
• Thin Film Thickness Measurement: Capable of measuring films from 1 nm up to several micrometres.
• Optical Constants (n & k): Determines refractive index (n) and extinction coefficient (k) of materials.
• Multi-Layer Capability: Can characterize single layers and complex multi-layer stacks (dielectrics, metals, semiconductors, polymers).
• Spectroscopic Analysis: Spectroscopic ellipsometers measure across a broad wavelength range (UV–Vis–NIR), providing dispersion data.
• Polarization-Based Technique: Works by analyzing changes in the polarization state of light after reflection/transmission.
• Automation & Modelling Software: Advanced software for data fitting, optical modelling, and material parameter extraction. Automated measurement routines for high-throughput labs.

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