Key Features:

• Electrical Measurement Capabilities: I–V (Current–Voltage) and C–V (Capacitance–Voltage) characterization of semiconductor devices. Multi-SMU support.
• Probe Station Integration: Precise micro-positioners with sharp probes to contact device pads. Works for wafer-level and chip-level testing.
• Device Versatility: MOSFET, JFET, Diode, LED, Biosensor, photodetector, solar cell, MEMS, and nanoscale device testing.
• Data Analysis & Modelling: Built-in software for parameter extraction (threshold voltage, mobility, subthreshold slope, etc.). Automated sweep and curve fitting.
• User Interface & Automation: PC-based control with graphical software. Low-noise triaxial cabling for ultra-low current measurements.

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